Download Advanced Test Methods for SRAMs: Effective Solutions for by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge PDF

By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel

Modern electronics rely on nanoscaled applied sciences that current new demanding situations by way of checking out and diagnostics. thoughts are rather liable to defects due to the fact they take advantage of the know-how limits to get the top density. This booklet is a useful advisor to the trying out and diagnostics of the newest new release of SRAM, probably the most largely utilized sorts of reminiscence. Classical tools for trying out reminiscence are designed to deal with the so-called "static faults," yet those try out options usually are not enough for faults which are rising within the newest Very Deep Sub-Micron (VDSM) applied sciences. those new fault types, known as "dynamic faults", aren't coated by means of classical attempt ideas and require the committed try sequences offered during this book.

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